WP1: “Design for Test”


Low-cost test methodologies


  • State of the art contains some test cases. Standardization is required to propose the best solution at the earliest steps of the MNS design among:
    • Built-in Self Test: by reducing the demands on ATE, BIST will strongly reduce test costs. Next steps will concern on-line testing, self-calibration and self-repair
    • Self-calibration, self repair, reconfiguration schemes, diagnosis


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