Back to Events First workshop organized by Reliability & Characterisation Cluster of PATENT-DfMM 7-8 October 2004, Sinaia, Romania The first workshop of the Reliability & Characterisation Cluster of PATENT-DfMM network of excellence was held in Sinaia, Romania, 7-8 October, as a joint event with the IEEE International Semiconductor Conference (CAS 2004). The program contained solely contributions given by cluster members: "RF-MEMS reliability research at IMEC" (Ingrid de Wolf, IMEC Leuven), "Reliability research at IXL Bordeaux" (Claude Pellet, IXL Bordeaux), "Accelerated testing: from Microelectronics to MEMS" (Marius Bazu, IMT Bucharest), "Laser accelerated aging of semiconductor chips" (Lucian Galateanu, IMT Bucharest), "BUTE activities in material characterisation" (Andras Poppe, BUTE Budapest), "WP3 database - first results" (Adrian Frumuselu, IMT Bucharest ), "Recent work at IEF on materials, testing and packaging of MEMS" (Alain Bosseboeuf, IEF Paris), "Material characterisation at LAAS Toulouse" (Karim Yacine, LAAS Toulouse), "Standardization for MEMS" (Virgil Ilian, IMT Bucharest), "About a new STREP in microfluidics" (Catalin Tibeica, IMT Bucharest).