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PATENT/AMICOM Joint Workshop on MEMS Reliability at ESREF Conference This event will enable the members from two European Networks of Excellence, PATENT and AMICOM, and the participants of the ESREF Conference to share know-how on MEMS Reliability issues. The workshop studies all aspects of MEMS Reliability. Topics include but are not limited to: characterization methods, failure mechanisms, failure analysis, testing techniques and test structures, reliability techniques and methodology, design rules. Contributors should submit a short abstract (1 or 2 pages) including title and authors’ affiliation, address and email. The abstract should reflect the significance of the contribution. The exact duration of the talks will depend on the final program. Abstract Deadline: 31 July 2006. |