NEXUS MWG Reliability & Test
DfMM Tutorial Session and MEMUNITY workshop
NEXUS Annual General Meeting and FP7 Workshop
27-28 Nov 2006, Milan/Italy

The “NEXUS Methodology Working Group (MWG) in Reliability and Test” was launched in December 2005 in close collaboration with the PATENT-DfMM project and MEMS Industry Group (MIG) in the US.
A joint public workshop with MEMUNITY and Caneus has taken place at the Politecnico di Milano on 27 - 28 November 2006.

The NEXUS Association Annual General Meeting (AGM) and a NEXUS plus Workshop to prepare for the first Call of the 7th Framework Programme (FP7) of the European Commission have been held in conjunction on 29 November.

Please find the provisional agenda for this 3-day event below. Participation is free of charge, however registration is required.

27 November 2006

PATENT-DfMM and MEMUNITY Workshop, Tutorials and Equipment Demos


12:00     Registration + Snack
12:45     Welcome and Introduction (Patric Salomon, 4M2C / enablingMNT)
13:00     PATENT-DfMM Tutorial "Reliability issues in MEMS: physics of failure and design for reliability"
              (Ingrid De Wolf, IMEC)
14:30     MEMUNITY Introduction "MEMS Test Challenges on Wafer level" (Frank-Michael Werner,
              Jens Klattenhoff, MEMUNITY)
15:00     Coffee break at "mini exhibition" (PATENT posters and MEMUNITY demo tables)
15:30     PATENT-DfMM Tutorial "Damping Effects in MEMS" (Attilio Frangi, Politecnico di Milano)
              
Overview of techniques for evaluation of gas and solid damping at pressures ranging from ambient
              conditions (1 bar)
to near vacuum (1 µbar)
/ in parallel to / 
              MEMUNITY Equipment Demo:  "Automated membrane test using different techniques"
17:00     End of meeting

28 November 2006

NEXUS Methodology  Working Group Reliability and Test


Morning Theme : Advances in Reliability & Test, Key Projects

  9:00     Introduction (Andrew Richardson, Lancaster University)
  9.30      Keynote: Reliability Challenges for MEMS Integration (Benedetto Vigna, ST Microelectronics)
10:00     Reliability Flagship Project in NoE PATENT-DfMM (Ingrid De Wolf, IMEC)
10.30     Coffee break
11.00     Reliability aspects of silicon MEMS for automotive applications (Matthias Ebert, Fraunhofer-IWMH
              and Roland Müller-Fiedler, Bosch
)


11.30     MEMS Reliability Challenges in EURELNET (Yves OUSTEN, IXL)
12:00     Map of activities – discussion
12:30     Lunch

Afternoon Theme: Future Networks, projects and collaboration

13.30     Caneus Pilot Project “Reliability” output and future business model (Philippe Perdue, CNES)
14:00     Parameter Identification of Pressure Sensors at Wafer Level (Steffen Michael, Melexis)
14:15     MEMS Test Challenges: Applications, solutions and future visions (MEMUNITY)
14:30     Briefing on Breakout Sessions
14:45     Focus Groups
                 1. Failure mechanisms, modelling and fault simulation 
                 2. Accelerated Testing, Test Strategies and Reliability indicators
                 3. Collaboration / business models for future initiatives
15.30     Coffee break
16.00     Focus group reports
16:30     Discussion on actions and way forward 
                 EC FP7 opportunities
                 Linking existing networks
                 Private sector funding

29 November 2006


NEXUS Annual General Meeting (AGM) and EC FP7 Workshop

Morning: NEXUS AGM

  9:00     Introduction & Welcome (Sean Neylon, Colibrys)
  9:15     Chairman’s Report 2006 (Sean Neylon, Colibrys):
                 Transfer from France to Switzerland
                 Changes in Organisation
                 Future strategy / value to membership
10:15     Coffee break
10:30     Financial Report  (David Holden, CEA):
                 Financial status 2006
                 Budget proposal 2007
                 Future funding   
11:30     Election of members to Steering Committee
11:45     Questions
12:30     Close of meeting/ Lunch

Afternoon: NEXUSplus FP7 (Draft Agenda)

14:00     Introduction & Welcome (Sean Neylon, Colibrys)
14:15     Presentations:
               Overview Status of FP7 Call 1 and 2  (EC, TBA)
               IP/NOE future participation in FP7: New skills, changes in objectives e.g.
Smarthealth,
               INTEGRAMplus, Summary of other IP/NoE’s
               MINOS presentation (TBA)
               MNT Roadmaps (Patric Salomon)

15:30     Interactive workshop: Round table thematic discussions
               Medical/Life Sciences
               Harsh environment
               Consumer
               Transportation
               IT Multimedia
               MWG’s (Design, Packaging, Test, Reliability)
16:30     Round table summaries

 

Venue

The meetings will take place at the Politecnico di Milano ( www.polimi.it )
The address is: Piazza Leonardo da Vinci 32, 20133 Milan, Italy
Local organiser: Prof. Alberto Corigliano, Office Phone: + 39 02 2399 4209
Nearest Metro Station: Piola - Green line (2)
We recommend the Hotel Lombardia ( www.hotellombardia.com ) which has a "Politecnico" rate of 85€ for a single room and 128€ for a double room, breakfast included. It is at walking distance from Politecnico (approx 10 minutes). You can either make your booking by E-mail info@hotelombardia.com or phone +39 022892515.

Please make your own hotel reservation!


If you have any questions concerning the meeting and registration, please forward them to:

Lorna Quinn (Project Manager of PATENT-DfMM)
E-mail: L.Quinn@lancaster.ac.uk, Phone: +44 1524 593053
PATENT-DfMM contact:
E-mail: info@patent-dfmm.org
www.patent-dfmm.org

NEXUS Association contact:
NEXUS Office (Neuchâtel)
E-mail: info@nexus-mems.com
www.nexus-mems.com

Contact MEMUNITY:
Frank-Michael Werner, E-Mail: fmwerner@sussdd.de
and Jens Klattenhoff, E-Mail: j.klattenhoff@polytec.de
www.memunity.com

Programme (PDF) for Download
Registration Form (WORD)