PATENT-DfMM at UK CEMMNT Project Launch Event
2 May 2007, Loughborough, UK

The Centre of Excellence in Metrology for Micro and Nano Technologies (CEMMNT) celebrates its official launch on Wednesday, 2 May 2007, at the Systems Engineering Innovation Centre (SEIC) in Loughborough, UK. CEMMNT provides industry with open access to measurement and characterisation techniques and expertise. The event which aims to bring together over 150 major players in Micro and Nano Technology (MNT). The meeting includes technical presentations, panel discussions, an exhibition and ample networking opportunities.
PATENT-DfMM will be represented through presentations, a poster and information table. NEXUS, the European Microsystems Association will also have a session within the event.

For further information, visit http://www.cemmnt.co.uk/events.html

Download Flyer (PDF)