PATENT-DfMM and NEXUS MWG Design Modelling Simulation Workshop
25 Jan 07, Berlin, Germany
The objective of this workshop was to identify needs of the Microsystems/MEMS industry (fabless design houses, manufacturers, etc.) in terms of design methodology, services and software tools. The “Design for Micro & Nano Manufacture Network of Excellence (PATENT-DfMM)” had defined an internal project to assess these needs and to initiate the research to address these needs. As an outcome, PATENT-DfMM aims at a first draft road map identifying key challenges as well as probable developments associated with future design methodologies and tools in the areas of DfT (Test), DfR (Reliability) and DfP (Packaging) strategies for MNT, summarised under DfMM.
33 MEMS designers from industry and research labs, as well as MEMS software tool providers from several European countries participated in this workshop. A copy of the resulting “roadmap documentation” will be distributed to all active participants and to those who contribute to the work remotely. The workshop was jointly organised by the NEXUS MWG Design Modelling Simulation (DMS) and the PATENT-DfMM NoE.
Contacts:
Patric Salomon, 4M2C, E-mail: patric.salomon@4m2c.com
Dagmar Peters, ITEM University of Bremen, E-mail: peters@item.uni-bremen.de
Programme updates will be available at http://www.patent-dfmm.org
The workshop was structured into short presentations, work groups and plenary discussion sessions. This format provided the best opportunities for participants to hear about latest developments, network, to discuss needs and ideas in small groups and to generate outcomes that will focus future research in DfMM on the real needs of the industry.
Agenda
- Welcome and Scope of this workshop
Patric Salomon, 4M2C GmbH
- Introduction and PATENT results in the fields of Design for Test, Design for Reliability, Package Engineering and on Modelling and Simulation methods in general
Andrew Richardson, Lancaster University, UK
- Design and Virtual Manufacture in INTEGRAMplus
Gerold Schröpfer, Coventor, France
- Towards an Integrated Design approach for Si+NonSi MEMS Methodology
Markus Dickerhof, FZ Karlsruhe, Germany
- Parallel Workgroup sessions, followed by final presentation and discussions of the achieved results:
- How to integrate process scattering into the design flow?
- Modelling and simulation challenges on the way from micro- to nanosystems
- Reliability assessment of brittle MEMS structures based on FE-simulation, size effect theory and probabilistic sampling
Matthias Ebert, Fraunhofer IWMH, Germany
- Design for Test
Frank Poehl, Infineon Technologies AG, Germany
- Parallel Workgroup sessions, followed by final presentation and discussions of the achieved results:
- Needs for modelling and simulation of multi physical systems
- How to integrate testability into a design flow?
- Concept for the commercialisation of Design Services in the framework of the TechNet Alliance
Wolfgang Brose, CADFEM
- Europractice Service Clusters – Opportunities for new Projects in FP7
Patric Salomon, 4M2C GmbH, Germany
- Final discussion