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Workshop on Reliability & DfX Engineering for System-in-Package Technologies
In Conjunction with European Test Symposium 2008
Grand Hotel Majestic, Pallanza, Lago Maggiore, Italy
Thursday, May 29th, 2008
The SiPeX workshop aims to bring together reliability and test engineers to discuss advanced design methodologies, integration technology and assembly engineering for SiP solutions that embrace heterogeneity, multiple energy domains and mixed technology platforms.
Sponsors
- Patent-DfMM, the FP6 Network of Excellence in Design for Micro & Nano Manufacture

- ieMRC, the UK Innovative Electronics Manufacturing Centre

- INTEGRAMplus, FP6 Integrated Project "Integrated Micro & Nanotechnology Platforms and Services"

Program
| 8h00 |
Registration |
| 8h30-8h45 |
Welcome Address
Andrew Richardson, University Lancaster |
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Session 1 - Overview of integration technologies |
| 8h45-9h15 |
Reliability & Test Challenges around C2W and W2W SiP assemblies
Norman Marenco, Fraunhofer ISIT |
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| 9h15-9h45 |
Reliability studies around the PICS, System-in-Package Technology A Richardson, Lancaster University |
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| 9h45-10h15 |
Reliability and Test Challenges in Bio-SiP
Hans Kerkhoff, University of Twente
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| 10h15-10h30 |
Discussion on Generic Challenges for the Test and Reliability Community |
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| 10h30-11h00 |
Coffee |
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Session 2 - Design for test, Design for Reliability |
| 11h-11h30 |
Evaluation of mixed-signal/RF DFT solutions for SiP devices using statistical techniques Salvador Mir, TIMA / INPG |
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| 11h30-12h |
Reliability and Test Challenges in Multi-Technology SiP platforms within the INTEGRAMplus service Chris Reeves, QinetiQ |
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| 12h-12h30 |
On-Line Testing of Ohmic RF MEMS Switches for SiP applications
Jari Hannu, Markus Ängeslevä and Markku Moilanen University of Oulu, Finland |
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Session 3 – Reliability and Test |
| 14h-14h30 |
Reliability and Test Challenges of NoC on 3D SiP platforms
Dr. Li-Rong Zheng, KTH, Sweden |
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| 14h30-15h |
Embedded Test Challenges around SiP technologies
Prof. Pascal Nouet LIRMM / University Montpellier II |
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| 15h-15h30 |
Modelling Methodologies for Reliability and Prognostics of SiP Structures – Current Capabilities and Future Challenges
Chris Bailey and Stoyan Stoyanov, Univ. Greenwich |
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| 15h30-16h |
Coffee & Posters |
| 16h30 |
Open discussion on new initiatives and conclusions
Andrew Richardson, University Lancaster |
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Workshop Chair
Prof. Andrew Richardson
Lancaster University
Lancaster, LA1 4YR, UK
Tel.: +44 1524 593018
Fax: +44 1524 592777
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Workshop Co-Chair
Prof. Pascal Nouet
University Montpellier II -
LIRMM / CNRS
Montpellier, France
Tel.: +33 467 418 527
Fax: +33 467 418 500
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