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Workshop on Design for Reliability and Manufacturability in MNT
24 April 2007 (9:00-17:30), Stresa, Italy (in conjunction with DTIP, 25-27 April)

Co-organised by the EC-funded Network of Excellence "Design for Micro & Nano Manufacture" (PATENT-DfMM) and the NEXUS Methodology Working Groups "Reliability & Test" and "Design Modelling Simulation". PATENT-DfMM was launched in 2004 and aims to establish a collaborative team to provide European industry with support in the field of "Design for Micro and Nano Manufacture (DfMM)" to ensure that problems affecting the manufacturing and reliability of products based on micro nano technologies (MNT) can be addressed before prototyping and production. PATENT-DfMM co-operates worldwide to coordinate research and services in DfMM related topics.


Presentations now available for download:

9h15   Welcome and programme presentation
9h20   NEXUS Overview  
       
9h30 Session 1 - Manufacturability into the design flow  
  9h30 Overview on the "Design for Micro&Nano Manufacture (PATENT-DfMM)" Project
  9h50 Reliable Micro and Nano System Design Using Multi Level Process Verification
  10h10 "INTEGRAMplus" - a new Europractice Service Project providing Development Platforms for Integrated Micro-Nano Technologies and Products.  
       
10h30 mini-panel - conclusions  
       
10h45 Coffee break  
       
11h15 Session 2 - Measuring the real world, solutions and alternatives.  
  11h15 The future of Embedded Test within the Design for Micro & Nano manufacture NoE
  11h45 MEMS Reliability and Test Issues in Micromachine Center Programs
       
12h15 mini-panel - conclusions  
       
12h30 Lunch  
       
14h00 Session 3 - Reliability assessments, state of the art and further needs
  
  14h00 Failure and dissipative mechanisms
  14h20 Accelerated reliability testing
  14h40 Design for yield
       
15h00 mini-panel - conclusions  
       
15h15 Coffee break  
       
15h45 Session 4 : Reliability & Test within EC FP7 supported by NEXUSplus  
  15h45 Initial Calls - FP7 program - MicroNanoSystems
  16h05 New Proposals in Reliability Engineering from the PATENT-DfMM NoE
  16h15 Open Microphone for new FP7 proposals in the Reliability & Test area  
  16h35 Break out sessions Building new FP7 proposals)

1. Reliability Engineering

2. Embedded Test & Health Monitoring

Conclusions
       
17h30 End of workshop  
       
DTIP Panel Discussion on 26 April 2007: Design for Reliability and Test of Microsystems
       
Moderator:      

Patric Salomon: Managing Director - 4M2C PATRIC SALOMON GmbH,
Germany and Vice Chairman of NEXUS Microsystems Association
       
Panellists:      
  Andrew Richardson Director - Centre for Microsystems Engineering, Lancaster University, UK
  Alistair Sutherland Technical Director, BCF Designs, UK
  Ludo Stulens Senior Consultant, Philips Applied Technologies, The Netherlands
  Chris Reeves Microsystems Business Stream Manager, QinetiQ, UK
       

 

Objective of the workshop

This workshop builds on industry experience in microsystems’ manufacturing as discussed within the MEMS Industry Group METRIC workshops and NEXUS Methodology Working Group meetings. Main emphasis will be on reliability and test problems, where design methodologies can lead to significant improvements. The workshop will discuss how to leverage the design, reliability and test communities over the coming years for the benefit of European competitiveness; this might include the need for new European and International collaborative initiatives. In addition, further industry demand for advances in Design, Reliability and Test capability will be addressed.


The Venue

Regina Palace Hotel - Stresa, Lago Maggiore, Italy
http://tima.imag.fr/conferences/dtip/DTIP2007/HotelRegistrationForm.html


Registration fee

€120 (including coffee breaks and lunch on 24 April); For registrations after 5 April: €160.

Please register for this 1 day Workshop on Design for Micro & Nano Manufacture through the DTIP registration form at http://tima.imag.fr/conferences/dtip/DTIP2007/Registration_Fee.pdf
Hotel and venue information is also available from http://tima.imag.fr/conferences/dtip

The detailed programme of the workshop will be updated at: http://www.patent-dfmm.org.
For additional information or if you are interested in presenting within this workshop, please contact: Patric Salomon, 4M2C PATRIC SALOMON GmbH, Germany, E-mail: patric.salomon@4m2c.com


DTIP (25 – 27 April)

DTIP is the symposium on Design, Test, Integration and Packaging of MEMS and MOEMS. The goal of DTIP is to provide a forum for in-depth investigations and interdisciplinary discussions involving design, modelling, testing, micromachining, microfabrication, integration and packaging of structures, devices, and systems. More information at http://tima.imag.fr/conferences/dtip

PATENT-DfMM and NEXUS are also co-organising a special session within DTIP on “Opportunities for Cooperative R&D” (25 Apr) and a panel discussion on “Design for Reliability and Test of Microsystems” (26 Apr). In the panel industrial microsystems manufacturers will present the way they deal with reliability and test issues currently and what their main challenges are. Also results from the Workshop on 24 April will be summarised.