- For complex systems, it has been demonstrated that it is generally cheaper to verify the physical integrity of the device rather than its functional behaviour.
- Our research aims to develop structural-based testing by providing the necessary knowledge to the community:
- Fault modelling and fault simulation: models generally cover the nominal first order behaviour of MNT devices. Links between levels of abstraction (FEM, nodal, VHDL-AMS) are not common.
- Defects and failure modes: Defects in MNT are strongly dependent on both technology and application.
 Defect due to under-etching in a FSBM post-process (LIRMM, 2004)
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