Design for Testability of MNS
Title:
Microsystems testing: an approach and open problems
Author(s):
Lubaszewski, M.; Cota, E.F.; Courtois, B.
Reference:
Design, Automation and Test in Europe, 1998., Proceedings, Vol., Iss., 23-26 Feb 1998, Pages:524-528
Title:
From microelectronics to MEMS testing
Author(s):
COURTOIS B., MIR S., CHARLOT B., LUBASZEWSKI M.
Reference:
Publ. in IEEE Microelectronics Reliability and Qualification Workshop, Glendale, California, USA, 1 November 2000 , IEEE, [Publ. Year] 2000
Title:
On-chip pseudorandom MEMS testing
Author(s):
RUFER L., MIR S., SIMEU E., DOMINGUES CH.
Reference:
Publ. in 9th International Mixed-Signal Testing Workshop (IMSTW’03), Sevilla, Spain, June 25-27 , [Publ. Year] 2003
Title:
On-chip testing of MEMS using pseudo-random test sequences
Author(s):
RUFER L., MIR S., SIMEU E., DOMINGUES CH.
Reference:
Publ. in Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP'03), Cannes, France, May 5-7 , SPIE, [Publ. Year] 2003
Title:
Generation of electrically induced stimuli for MEMS self-test
Author(s):
CHARLOT B., MIR S., PARRAIN F., COURTOIS B.
Reference:
in JETTA : Journal of Electronic Testing - Theory and Applications, Vol.17, No. 6, December , [Publ. Year] 2001
Title:
An integrated diagnostic reconfiguration (IDR) technique for fault tolerant mixed signal microsystems
Author(s):
Sharif, E.; Dorey, T.; Richardson, A.
Reference:
Electronics, Circuits and Systems, 1998 IEEE International Conference on, Vol.1, Iss., 1998, Pages:413-416 vol.1
Title:
On the use of an oscillation-based test methodology for CMOS micro-electro-mechanical systems
Author(s):
Beroulle, V.; Bertrand, Y.; Latorre, L.; Nouet, P.
Reference:
Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings, Vol., Iss., 2002, Pages: 1120-
Title:
Evaluation of the oscillation-based test methodology for micro-electro-mechanical systems
Author(s):
Beroulle, V.; Bertrand, Y.; Latorre, L.; Nouet, P.
Reference:
VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE, Vol., Iss., 2002, Pages: 439- 444
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